| Picture Samples |
Model |
Description |
Resonance Frequency
(kHz) |
Spring Constant
(N/m) |
Cantilever
Length/W/T (μm) |
| Tapping Mode, Intermittent Contact Mode |
 |
Tap300-G |
for Tapping Mode, Intermittent Contact Mode
Without Any Coatings, with Alignment grooves |
300 |
40 |
125/30/4 |
 |
Tap300Al-G |
for Tapping Mode, Intermittent Contact Mode
With Aluminium Reflex Coating, with Alignment grooves |
300 |
40 |
125/30/4 |
 |
Tap190-G |
for Tapping Mode, long cantilever
Without Any Coating, with Alignment grooves |
190 |
48 |
225/38/7 |
 |
Tap190Al-G |
for Tapping Mode, long cantilever
With Aluminium Reflex Coating and Alignment grooves |
190 |
48 |
225/38/7 |
 |
Tap150-G |
for Soft Tapping Mode, Intermittent Contact Mode
Without Any Coatings, with Alignment grooves |
150 |
5 |
125/25/2.1 |
 |
Tap150Al-G |
for Soft Tapping Mode, Intermittent Contact Mode
With Aluminium Reflex Coating and Alignment grooves |
150 |
5 |
125/25/2.1 |
| Force Modulation AFM probes |
 |
Multi75-G |
for Force Modulation Mode Measurements
Without Any Coatings |
75 |
3 |
225/28/3 |
 |
Multi75Al-G |
for Force Modulation Mode Measurements
With Aluminium Reflex Coating and Alignment grooves |
75 |
3 |
.225/28/3 |
| Contact Mode AFM probes |
 |
Contact-G |
for Contact Mode Measurements
Without Any Coatings |
13 |
0.2 |
450/50/2 |
 |
ContAl-G |
for Contact Mode Measurements
With Aluminium Reflex Coating and Alignment grooves
Without Any Coatings |
13 |
0.2 |
450/50/2 |
| Conductive AFM probes |
 |
Electri
Tap300-G |
for Tapping, Intermittent Contact and electric modes, Alignment Grooves
Electrically conductive coating |
300 |
40 |
125/30/4 |
 |
Electri
Tap190-G |
for Tapping, Intermittent Contact and electric modes, features long cantilever, Alignment Grooves
Electrically conductive coating |
190 |
48 |
225/38/7 |
 |
Electri
Multi75-G |
for Force Modulation, Pulsed Force Mode (PFM) and electric modes, Alignment Grooves
Electrically conductive coating |
75 |
3 |
225/28/3 |
 |
Electri
Cont-G |
for Contact Mode and electric modes, Alignment Grooves
Electrically conductive coating |
13 |
0.2 |
450/50/2 |
| Gold coated AFM Probes |
 |
Tap300GD-G |
Gold Coating as a back side reflex coating for our Tapping mode AFM probes with Alignment Grooves |
300 |
40 |
125/30/4 |
 |
Tap190GD-G |
Gold Coating as a back side reflex coating for our Tapping mode AFM probes with Alignment Grooves |
190 |
48 |
225/38/7 |
 |
Multi75GD-G |
Gold Coating as a back side reflex coating for our Force modulation AFM probes with Alignment Grooves |
75 |
3 |
225/28/3 |
 |
ContGD |
Gold Coating as a back side reflex coating for our Contact mode AFM probes, Without Alignment Grooves |
13 |
0.2 |
450/50/2 |
 |
ContGD-G |
Gold Coating as a back side reflex coating for our Contact mode AFM probes with Alignment Grooves |
13 |
0.2 |
450/50/2 |
 |
Tap300GB-G |
Gold Coating as an overall Gold Coating covering both sides of the cantilever: Tapping mode AFM probes Without Alignment Grooves |
300 |
40 |
125/30/4 |
 |
Multi75GB-G |
Gold Coating as an overall Gold Coating covering both sides of the cantilever: Force modulation AFM probes with Alignment Grooves |
75 |
3 |
225/28/3 |
 |
ContGB-G |
Gold Coating as an overall Gold Coating covering both sides of the cantilever: Contact mode AFM probes with Alignment Grooves |
13 |
0.2 |
450/50/2 |
| Magnetic AFM Probes |
 |
Magnetic
Multi75-G |
for Magnetic AFM probes with Alignment Grooves
Tip side coating – Magnetic / Detector side coting – Aluminium |
75 |
3 |
225/28/3 |
| Silicon Nitride AFM probes |
 |
SiNi |
for Soft Contact Mode,
4 Silicon Nitride Cantilevers, Triangular, 2 diffrent Lengths |
short: 30
long: 10 |
short: 0.27
long: 0.06 |
100/16/0.52
200/30/0.52 |
| Diamond-Like-Carbon coated AFM Probes |
 |
Tap300DLC |
for Tapping Mode, Intermittent Contact Mode
With DLC coating, with Alignment grooves
(Aluminum coating on detector side) |
300 |
40 |
125/30/4 |
 |
Tap190DLC |
for Tapping Mode, long cantilever
With DLC coating, with Alignment grooves
(Aluminum coating on detector side) |
190 |
48 |
225/38/7 |
 |
Tap150DLC |
for Soft Tapping Mode, Intermittent Contact Mode
With DLC coating, with Alignment grooves
(Aluminum coating on detector side) |
150 |
5 |
125/25/2.1 |
 |
Multi75DLC |
for Force Modulation Mode Measurements
With DLC coating, with Alignment grooves
(Aluminum coating on detector side) |
75 |
3 |
225/28/3 |
 |
ContDLC |
for Contact Mode Measurements
With DLC coating, with Alignment grooves
(Aluminum coating on detector side) |
13 |
0.2 |
450/50/2 |
| High Resolution AFM Probes |
 |
SHR300 |
Tapping Mode AFM Probe with a Sharp Diamond-Like-Carbon Spike
(70nm Gold on both sides of the cantilever. Carbon spike not coated!) |
300 |
40 |
125/30/4 |
 |
SHR150 |
Soft Tapping Mode AFM Probe with Aluminum Reflective Coating
(70nm Gold on both sides of the cantilever. Carbon spike not coated!) |
150 |
5 |
125/25/2.1 |
 |
SHR75 |
Force Modulation AFM Probe with Sharp Diamond-Like-Carbon Spike
(70nm Gold on both sides of the cantilever. Carbon spike not coated!) |
75 |
3 |
225/28/3 |
| All-In-One Probes |
 |
All-In-One |
All-In-One: AFM probe with four different cantilever types on a single chip.
Without Any Coatings.: Contact(A), Multi75(B), Tap150(C) and Tap300(D). |
15 (A)
80 (B)
150 (C)
350 (D) |
0.2 (A)
2.7 (B)
7.4 (C)
40 (D) |
500/30/2.7
210/30/2.7
150/30/2.7
100/50/2.7 |
 |
All-In-One-Al |
All-In-One-Al: AFM probe with four different cantilever types on a single chip.
With Aluminium Reflex Coating.: ContAl (A), Multi75Al (B), Tap150Al-G (C) and Tap300Al (D).. |
15 (A)
80 (B)
150 (C)
350 (D) |
0.2 (A)
2.7 (B)
7.4 (C)
40 (D) |
500/30/2.7
210/30/2.7
150/30/2.7
100/50/2.7 |
 |
All-In-One-Al |
All-In-One-Al: AFM probe with four different cantilever types on a single chip.
With Electrically conductive coating: Cont (A), Multi75 (B), Tap150-G (C) and Tap300 (D).. |
15 (A)
80 (B)
150 (C)
350 (D) |
0.2 (A)
2.7 (B)
7.4 (C)
40 (D) |
500/30/2.7
210/30/2.7
150/30/2.7
100/50/2.7 |
 |
All-In-One-TL |
All-In-One-Tipless: Tipless AFM probe with four different cantilever types on a single chip.
Without Any Coatings.: Contact(A), Multi75(B), Tap150(C) and Tap300(D). |
15 (A)
80 (B)
150 (C)
350 (D) |
0.2 (A)
2.7 (B)
7.4 (C)
40 (D) |
500/30/2.7
210/30/2.7
150/30/2.7
100/50/2.7 |
 |
All-In-One-Al-Tipless |
All-In-One-Tipless: Tipless AFM probe with four different cantilever types on a single chip.
With Aluminium Reflex Coating.: ContAl (A), Multi75Al (B), Tap150Al-G (C) and Tap300Al (D). |
15 (A)
80 (B)
150 (C)
350 (D) |
0.2 (A)
2.7 (B)
7.4 (C)
40 (D) |
500/30/2.7
210/30/2.7
150/30/2.7
100/50/2.7 |
| Calibration Standards |
| The die size of the TipCheck is 5x5mm. It comes glued onto a metal disc so that it is ready to be placed into your AFM set. |
TipCheck |
SPM sample for fast and convenient determination of the AFM tip condition. |
good tip
 |
worn tip
 |
blunt or broken
 |
 |
HS-20MG |
Height Calibration Standard with 20nm step height. |
Die size: 5x5mm
Step height: ~20nm, the precise value is stated on the label of each box.
Structure geometry:
– square holes and pillars with a 10µm pitch arranged in a 1x1mm square
– circular pillars and holes, and lines in the x- and y-direction with a 5µm pitch arranged in a 500×500µm square |
 |
HS-100MG |
Height Calibration Standard with 100nm step height. |
Die size: 5x5mm
Step height: ~100nm, the precise value is stated on the label of each box
Structure geometry:
– square holes and pillars with a 10µm pitch arranged in a 1x1mm square
– circular pillars and holes, and lines in the x- and y- direction with a 5µm pitch arranged in a 500×500µm square |
 |
HS-500MG |
Height Calibration Standard with 500nm step height. |
Die size:5x5mm
Step height: ~500nm, the precise value is stated on the label of each box
Structure geometry:
– square holes and pillars with a 10µm pitch arranged in a 1x1mm square
– circular pillars and holes, and lines in the x- and y -direction with a 5µm pitch arranged in a 500×500µm square |
 |
CS-20NG |
XYZ Nanogrid Calibration Standard. |
Die size: 5x5mm
Step height: ~20nm, the precise value is stated on the label of each box
Structure geometry:
– Square holes and pillars with 10um pitch arranged in a 1x1mm square
– Circular pillars and holes, and lines in the x- and y- direction with a 5um pitch arranged in a 500x500um square
– Circular holes with a 500nm pitch arranged in a 100x100um square |
