超小型データロガー、高温・低温データロガー、電子顕微鏡(SPM)・カンチレバー、金銀アルミコートスライドガラス

Option 定義:
A – Aluminium reflex coating, SS – Super sharp tip, TL – Tipless, G – Gold reflex coating, GG – Tip and reflex side gold coating.

Picture Samples	SPM Probe Model	Description	Resonance Frequency (kHz)	Spring Constant (N/m)	Cantilever Length (μm)
	ACCESS-C	Tip view- Contact, Uncoated, Si probe	16	0.3	450
	ACCESS-C-A	Tip view- Contact, Al (reflex side), Si probe	16	0.3	450
	ACCESS-EFM	Tip view- Electric Force Microscopy, PtIr-both sides, Si probe	60	2.7	245
	ACCESS-FM	Tip view- Force modulation, Uncoated, Si probe	60	2.7	245
	ACCESS-FM-A	Tip view- Force modulation, Al (reflex side), Si probe	60	2.7	245
	ACCESS-FM-GG	Tip view- Electric Force Microscopy, Au (both sides), Si probe	60	2.7	245
	ACCESS-NC	Tip view- Non contact/Tapping™, Uncoated, Si probe	300	78	150
	ACCESS-NC-A	Tip view- Non contact/Tapping™, Al (reflex side), Si probe	300	78	150
	ACCESS-NC-GG	Tip view- Non contact/Tapping™, Au (both sides), Si probe	300	78	150
	ACCESS-UHF	Ultra high frequency scanning, Uncoated, Tip view-Siprobe	1100	115	55
	ACCESS-UHF-A	Ultra high frequency scanning, Al (reflex side),Tip view-Si probe	1100	115	55
	ACL	Tapping™/Non-Contact, Long cantilever-Uncoated, Si probe	190	58	225
	ACL-SS	Super sharp (1-2 nm)- Tapping™/Non-Contact, Long cantilever-Uncoated, Si probe	190	58	225
	ACL-TL	Tipless- Tapping™/Non-Contact, Long cantilever-Uncoated, Si probe	190	58	225
	ACLA	Tapping™/Non-Contact, Long cantilever-Al (reflex side), Si probe	190	58	225
	ACLA-SS	Super sharp (1-2 nm)- Tapping™/Non-Contact, Long cantilever-Al (reflex side), Si probe	190	58	225
	ACLA-TL	Tipless- Tapping™/Non-contact, Long cantilever-Al (reflex side), Si probe	190	58	225
	ACLG	Tapping™/Non-Contact, Long cantilever-Au (reflex side), Si probe	190	58	225
	ACLG-TL	Tipless- Tapping™/Non-contact, Long cantilever-Au (reflex side), Si probe	190	58	225
	ACLGG	Tapping™/Non-Contact, Long cantilever-Au (both sides), Si probe	190	58	225
	ACST	Soft Tapping™/Non-Contact, Uncoated, Si probe	150	7.8	150
	ACST-SS	Super sharp (1-2 nm)- Soft Tapping™/Non-Contact, Uncoated, Si probe	150	7.8	150
	ACST-TL	Tipless- Soft Tapping™/Non-Contact, Uncoated, Si probe	150	7.8	150
	ACSTA	Soft Tapping™/Non-Contact, Al (reflex side), Si probe	150	7.8	150
	ACSTA-SS	Super sharp (1-2 nm)- Soft Tapping™/Non-Contact, Al (reflex side), Si probe	150	7.8	150
	ACSTA-TL	Tipless- Soft Tapping™/Non-Contact, Al (reflex side), Si probe	150	7.8	150
	ACSTG	Soft Tapping™/Non-Contact, Au (reflex side), Si probe	150	7.8	150
	ACSTG-TL	Tipless- Soft Tapping™/Non-Contact, Au (reflex side), Si probe	150	7.8	150
	ACSTGG	Soft Tapping™/Non-Contact, Au (both sides), Si probe	150	7.8	150
	ACT	Tapping™/Non-Contact , Uncoated, Si probe	300	37	125
	ACT-BALL	20 µm carbon ball tip- Tapping™/Non-contact, Uncoated, Si probe	300	40	125
	ACT-PTU	Flat top conical Si tip, Tapping™/Non-Contact, Uncoated	300	79	125
	ACT-SS	Super sharp (1-2 nm)- Tapping™/Non-Contact, Uncoated, Si probe	300	37	125
	ACT-TL	Tipless-Tapping™/Non-Contact, Uncoated, Si probe	300	37	125
	ACTA	Tapping™/Non-Contact, Al (reflex side), Si probe	300	37	125
	ACTA-BALL	20 µm carbon ball tip- Tapping™/Non-contact, Al (reflex side), Si probe	300	40	125
	ACTA-PTU	Flat top conical Si tip, Tapping™, Al (reflex side)	300	79	125
	ACTA-SS	Super sharp (1-2 nm)- Tapping™/Non-Contact, Al (reflex side), Si probe	300	37	125
	ACTA-TL	Tipless-Tapping™/Non-Contact, Al (reflex side), Si probe	300	37	125
	ACTG	Tapping™/Non-Contact, Au (reflex side), Si probe	300	37	125
	ACTG-BALL	20 µm carbon ball tip- Tapping™/Non-contact, Au (reflex side), Si probe	300	40	125
	ACTG-TL	Tipless-Tapping™/Non-Contact, Au (reflex side), Si probe	300	40	125
	ACTGG	Tapping™/Non-Contact, Au (both sides), Si probe	300	37	125
	ANSCM-PA	Conductive Tapping™/Non-contact ECM, PtIr-both sides, Si probe	300	40	125
	ANSCM-PA5	Conductive Tapping™/Non-contact ECM, Thick-PtIr-both sides, Si probe	300	40	125
	ANSCM-PC	Conductive Contact ECM, PtIr-both sides, Si probe	12	0.2	450
	ANSCM-PT	Conductive Force modulation ECM, PtIr-both sides, Si probe	60	3	225
	DD-ACCESS-NC-A	Doped Diamond-Conductive-Tip View-Tapping™/Non-contact, Al (reflex side), Si tip	300	93	160
	DD-ACTA	Doped diamond- Conductive- Tapping™/Non-contact, Al (reflex side), Si tip	300	40	125
	DD-FORTA	Doped diamond- Conductive- Force modulation, Al (reflex side), Si tip	62	3	225
	DD-SICONA	Doped diamond- Conductive- Contact, Al (reflex side), Si tip	12	0.2	450
	FORT	Force modulation, Uncoated, Si probe	61	1.6	225
	FORT-BALL	20µm carbon ball tip- Force modulation, uncoated, Si probe	62	1.7	225
	FORT-PTU	Flat top conical Si tip, Force modulation, Uncoated	60	3.4	225
	FORT-SS	Super sharp (1-2 nm)- Force modulation, Uncoated, Si probe	61	1.6	225
	FORTA-TL	Tipless- Force modulation, Al (reflex side), Si probe	61	1.6	225
	FORTG	Force modulation, Au (reflex side), Si probe	61	1.6	225
	FORTG-BALL	20 µm carbon ball tip- Force modulation, Au (reflex side), Si probe	62	1.7	225
	FORTG-TL	Tipless- Force modulation, Au (reflex side), Si probe	61	1.6	225
	FORTGG	Force modulation, Au (both sides), Si probe	61	1.6	225
	HART0-1	High aspect ratio probes with 1µm spike and no tilt compensation; Uncoated	300	40	125
	HART0-2	High aspect ratio probes with 2µm spike and no tilt compensation; Uncoated	300	40	125
	HART12-2	High aspect ratio probes with 1µm spike and 12° tilt compensation; Uncoated	300	40	125
	HART12-4	High aspect ratio probes with 4µm spike and 12° tilt compensation; Uncoated	300	40	125
	HART12-6	High aspect ratio probes with 6µm spike and 12° tilt compensation; Uncoated	300	40	125
	HART3-1	High aspect ratio probes with 1µm spike and 3° tilt compensation; Uncoated	300	40	125
	HART3-2	High aspect ratio probes with 2µm spike and 3° tilt compensation; Uncoated	300	40	125
	HARTA0-1	High aspect ratio probes with 1µm spike and no tilt compensation; Reflex side Al coated	300	40	125
	HARTA0-2	High aspect ratio probes with 2µm spike and no tilt compensation; Reflex side Al coated	300	40	125
	HARTA12-2	High aspect ratio probes with 1µm spike and 12° tilt compensation; Reflex side Al coated	300	40	125
	HARTA12-4	High aspect ratio probes with 4µm spike and 12° tilt compensation; Reflex side Al coated	300	40	125
	HARTA12-6	High aspect ratio probes with 6µm spike and 12° tilt compensation; Reflex side Al coated	300	40	125
	HARTA3-1	High aspect ratio probes with 1µm spike and 3° tilt compensation; Reflex side Al coated	300	40	125
	HARTA3-2	High aspect ratio probes with 2µm spike and 3° tilt compensation; Reflex side Al coated	300	40	125
	HYDRA-All	Contact/Non-contact/Tapping™/Force spectroscopy, Uncoated-4V shaped probes per chip	66 (A) 17 (B) 67 (C) 17 (D)	0.292 (A) 0.045 (B) 0.405 (C) 0.081 (D)	100 (A) 200 (B) 100 (C) 200 (D)
	HYDRA-All-G	Contact/Non-contact/Tapping™/Force spectroscopy, Au (reflex side)-4V shaped probes per chip	66 (A) 17 (B) 67 (C) 17 (D)	0.292 (A) 0.045 (B) 0.405 (C) 0.081 (D)	100 (A) 200 (B) 100 (C) 200 (D)
	HYDRA2R-100N	Contact/Force spectroscopy, Uncoated-Rectangular(100 µm long/0.2 µm thick)-Narrow-Si3N4 cantilever probe	21	0.011	100
	HYDRA2R-100NG	Contact/Force spectroscopy, Au (reflex side)-Rectangular(100 µm long/0.2 µm thick)-Narrow-Si3N4 cantilever probe	21	0.011	100
	HYDRA2R-100NG-TL	Tipless, Contact/Force spectroscopy, Au (reflex side)-Rectangular(100 µm long/0.2 µm thick)-Narrow-Si3N4 cantilever probe	26	0.011	100
	HYDRA2R-100NGG	Contact/Force spectroscopy, Au (both sides)-Rectangular(100 µm long/0.2 µm thick)-Narrow-Si3N4 cantilever probe	21	0.011	100
	HYDRA2R-100NGG-TL	Tipless, Contact/Force spectroscopy, Au (both sides)-Rectangular(100 µm long/0.2 µm thick)-Narrow-Si3N4 cantilever probe	26	0.011	100
	HYDRA2R-50N	Contact/Force spectroscopy, Uncoated-Rectangular(50 µm long/0.2 µm thick)-Narrow-Si3N4 cantilever probe	77	0.084	50
	HYDRA2R-50NG	Contact/Force spectroscopy, Au (reflex side)-Rectangular(50 µm long/0.2 µm thick)-Narrow-Si3N4 cantilever probe	77	0.084	50
	HYDRA2R-50NG-TL	Tipless- Contact/Force spectroscopy, Au (reflex side)-Rectangular (50 µm long/0.2 µm thick)-Narrow-Si3N4 cantilever probe	104	0.084	50
	HYDRA2R-50NGG	Contact/Force spectroscopy, Au (both sides)-Rectangular(50 µm long/0.2 µm thick)-Narrow-Si3N4 cantilever probe	77	0.084	50
	HYDRA2R-50NGG-TL	Tipless- Contact/Force spectroscopy, Au (both sides)-Rectangular (50 µm long/0.2 µm thick)-Narrow-Si3N4 cantilever probe	104	0.084	50
	HYDRA4V-100NG	Contact/Tapping™, Au (reflex side)-V shaped (100 µm long/0.4 µm thick)-Narrow-Si3N4 cantilever probe	42	0.088	100
	HYDRA4V-100NG-TL	Tipless- Contact/Tapping™, Au (reflex side)-V shaped (100 µm long/0.4 µm thick)-Narrow-Si3N4 cantilever probe	42	0.088	100
	HYDRA4V-100NGG	Triangular Silicon Nitride Cantilver; L = 100 um, f= 42 kHz, k = 0.088 N/m; Gold coated both sides; 10 probes/ box	42	0.088	100
	HYDRA4V-100NGG-TL	Triangular Silicon Nitride Cantilver; L = 100 um, f= 42 kHz, k = 0.088 N/m; Gold coated both sides; 10 probes/ box	42	0.088	100
	HYDRA6R-100N	Non-contact/Tapping™, Uncoated-Rectangular(100 µm long/0.6 µm thick)-Narrow-Si3N4 cantilever probe	66	0.284	100
	HYDRA6R-100NG	Non-contact/Tapping™, Au (reflex side)-Rectangular(100 µm long/0.6 µm thick)-Narrow-Si3N4 cantilever probe	66	0.284	100
	HYDRA6R-100NG-TL	Tipless, Non-contact/Tapping™, Au (reflex side)-Rectangular(100 µm long/0.6 µm thick)-Narrow-Si3N4 cantilever probe	78	0.284	100
	HYDRA6R-100NGG	Non-contact/Tapping™, Au (both sides)-Rectangular(100 µm long/0.6 µm thick)-Narrow-Si3N4 cantilever probe	66	0.284	100
	HYDRA6R-100NGG-TL	Tipless, Non-contact/Tapping™, Au (both sides)-Rectangular(100 µm long/0.6 µm thick)-Narrow-Si3N4 cantilever probe	78	0.284	100
	HYDRA6R-200N	Contact, Uncoated-Rectangular(200 µm long/0.6 µm thick)-Narrow-Si3N4 cantilever probe	17	0.035	200
	HYDRA6R-200NG	Contact, Au (reflex side)-Rectangular(200 µm long/0.6 µm thick)-Narrow-Si3N4 cantilever probe	17	0.035	200
	HYDRA6R-200NG-TL	Tipless, Contact, Au (reflex side)-Rectangular(200 µm long/0.6 µm thick)-Narrow-Si3N4 cantilever probe	20	0.035	200
	HYDRA6R-200NGG	Contact, Au (both sides)-Rectangular(200 µm long/0.6 µm thick)-Narrow-Si3N4 cantilever probe	17	0.035	200
	HYDRA6R-200NGG-TL	Tipless, Contact, Au (both sides)-Rectangular(200 µm long/0.6 µm thick)-Narrow-Si3N4 cantilever probe	20	0.035	200
	HYDRA6V-100N	Non-Contact/Tapping™, Uncoated-V shaped(100 µm long/0.6 µm thick)-Narrow-Si3N4 cantilever probe	66	0.292	100
	HYDRA6V-100NG	Non-Contact/Tapping™, Au (reflex side)-V shaped(100 µm long/0.6 µm thick)-Narrow-Si3N4 cantilever probe	66	0.292	100
	HYDRA6V-100NG-TL	Tipless- Non-Contact/Tapping™, Au (reflex side)-V shaped(100 µm long/0.6 µm thick)-Narrow-Si3N4 cantilever probe	66	0.292	100
	HYDRA6V-100NGG	Non-Contact/Tapping™, Au (both sides)-V shaped(100 µm long/0.6 µm thick)-Narrow-Si3N4 cantilever probe	66	0.292	100
	HYDRA6V-100NGG-TL	Tipless- Non-Contact/Tapping™, Au (both sides)-V shaped(100 µm long/0.6 µm thick)-Narrow-Si3N4 cantilever probe	66	0.292	100
	HYDRA6V-100W	Non-Contact/Tapping™, Uncoated-V shaped(100 µm long/0.6 µm thick)-Wide-Si3N4 cantilever probe	67	0.405	100
	HYDRA6V-100WG	Non-Contact/Tapping™, Au (reflex side)-V shaped(100 µm long/0.6 µm thick)-Wide-Si3N4 cantilever probe	67	0.405	100
	HYDRA6V-100WG-TL	Tipless- Non-Contact/Tapping™, Au (reflex side)-V shaped(100 µm long/0.6 µm thick)-Wide-Si3N4 cantilever probe	78	0.324	100
	HYDRA6V-100WGG	Non-Contact/Tapping™, Au (both sides)-V shaped(100 µm long/0.6 µm thick)-Wide-Si3N4 cantilever probe	67	0.405	100
	HYDRA6V-100WGG-TL	Tipless- Non-Contact/Tapping™, Au (both sides)-V shaped(100 µm long/0.6 µm thick)-Wide-Si3N4 cantilever probe	67	0.405	100
	HYDRA6V-200N	Contact, Uncoated-V shaped(200 µm long/0.6 µm thick)-Narrow-Si3N4 cantilever probe	17	0.045	200
	HYDRA6V-200NG	Contact, Au (reflex side)-V shaped(200 µm long/0.6 µm thick)-Narrow-Si3N4 cantilever probe	17	0.045	200
	HYDRA6V-200NG-TL	Tipless, Contact, Au (reflex side)-V shaped(200 µm long/0.6 µm thick)-Narrow-Si3N4 cantilever probe	20	0.045	200
	HYDRA6V-200NGG	Contact, Au (both sides)-V shaped(200 µm long/0.6 µm thick)-Narrow-Si3N4 cantilever probe	17	0.045	200
	HYDRA6V-200NGG-TL	Tipless, Contact, Au (both sides)-V shaped(200 µm long/0.6 µm thick)-Narrow-Si3N4 cantilever probe	20	0.045	200
	HYDRA6V-200W	Contact, Uncoated-V shaped(200 µm long/0.6 µm thick)-Wide-Si3N4 cantilever probe	17	0.081	200
	HYDRA6V-200WG	Contact, Au (reflex side)-V shaped(200 µm long/0.6 µm thick)-Wide-Si3N4 cantilever probe	17	0.081	200
	HYDRA6V-200WG-TL	Tipless, Contact, Au (reflex side)-V shaped(200 µm long/0.6 µm thick)-Wide-Si3N4 cantilever probe	20	0.081	200
	HYDRA6V-200WGG	Contact, Au (both sides)-V shaped(200 µm long/0.6 µm thick)-Wide-Si3N4 cantilever probe	17	0.081	200
	HYDRA6V-200WGG-TL	Tipless- Contact, Au (both sides)-V shaped(200 µm long/0.6 µm thick)-Wide-Si3N4 cantilever probe	17	0.081	200
	MAGT	Standard magnetic force microscopy-Medium moment, 50 nm Cr-Co both sides, Si probe	62	3.0	225
	MAGT-HM	High moment Magnetic force microscopy, 150 nm Cr-Co both sides, Si probe	62	3.0	225
	MAGT-LM	Low moment Magnetic force microscopy, 15 nm Cr-Co both sides, Si probe	62	3.0	225
	NITRA-All	Contact/Non-contact/Tapping™/Force spectroscopy, Au (reflex side)-4V shaped-Si3N4 cantilevers and tips per chip	50 (A) 15 (B) 53 (C) 16 (D)	0.292 (A) 0.045 (B) 0.405 (C) 0.081 (D)	100 (A) 200 (B) 100 (C) 200 (D)
	SHOCON	Contact, Short cantilever-Uncoated, Si probe	21	0.14	225
	SHOCON-SS	Super sharp (1-2 nm)- Contact, Short cantilever-Uncoated, Si probe	21	0.14	225
	SHOCON-TL	Tipless- Contact, Short cantilever-Uncoated, Si probe	21	0.14	225
	SHOCONA	Contact, Short cantilever-Al (reflex side), Si probe	21	0.14	225
	SHOCONA-SS	Super sharp (1-2 nm)- Contact, Short cantilever-Al (reflex side), Si probe	21	0.14	225
	SHOCONA-TL	Tipless- Contact, Short cantilever-Al (reflex side), Si probe	21	0.14	225
	SHOCONG	Contact, Short cantilever-Au (reflex side), Si probe	21	0.14	225
	SHOCONG-TL	Tipless- Contact, Short cantilever-Au (reflex side), Si probe	21	0.14	225
	SHOCONGG	Contact, Short cantilever-Au (both sides), Si probe	21	0.14	225
	SICON	Contact, Long cantilever-Uncoated, Si probe	15	0.29	450
	SICON-BALL	20 µm carbon ball tip- Contact, Uncoated-long cantilever, Si probe	17	0.33	450
	SICONA-PTU	Flat top conical Si tip, Contact, Al (reflex side)	13	0.31	450
	SICONA-SS	Super sharp (1-2 nm)- Contact, Long cantilever-Al (reflex side), Si probe	15	0.29	450
	SICONA-TL	Tipless- Contact, Long cantilever-Al (reflex side), Si probe	15	0.29	450
	SICONG	Contact, Long cantilever-Au (reflex side), Si probe	15	0.29	450
	SICONG-BALL	20 µm carbon ball tip- Contact, Au (reflex side)-long cantilever, Si probe	17	0.33	450
	SICONG-TL	Tipless- Contact, Long cantilever-Au (reflex side), Si probe	15	0.29	450
	SICONGG	Contact, Long cantilever-Au (both sides), Si probe	15	0.29	450
	VSCAN-Air	apping™/Contact for SCAN-ASYST , Al (reflex side)-V shaped-Si3N4 cantilever	66	0.292	100
	STM-PT	Etched STM probes made from 99.95% platinum 0.25 mm, dia. wire (0.25 mm in diameter); ROC < 20nm	–	–	–
	STM-W	Etched STM probes are made from 99.95% tungsten 0.25 mm wire; ROC < 20nm.	–	–	–
	FCL	5-Tipless Cantilevers for Force Calibration; Uncoated.	14/60/300 550/1000	0.12/0.98/12 30/77	442/218/96 71/52
	FCLA	5-Tipless Cantilevers for Force Calibration; Reflex side Al coated	14/60/300 550/1000	0.12/0.98/12 30/77	442/218/96 71/52
	SHS-01	XYZ calibraton reference;Step Height Standard 100 nm with a layer of Cr deposited to harden the surface.	–	–	–
	SHS-1	XYZ calibraton reference; Step Height Standard 1µm with a layer of Cr deposited to harden the surface.	–	–	–
	SHS-OX-01	XYZ calibraton reference; Step Height Standard 100 nm without Cr layer	–	–	–
	SHS-OX-1	XYZ calibraton reference; Step Height Standard 1µm – without Cr layer	–	–	–
	NIWD	Silicon nitride membranes; 200µm x 200µm; various coating options available	–	–	–
	NIWDS	Silicon nitride membranes; 20µm x 20µm; various coating options available	–	–	–
	OXWD	Silicon oxide membranes; 200µm x 200µm; various coating options available	–	–	–
	OXWDS	Silicon oxide membranes; 20µm x 20µm; various coating options available	–	–	–
	SIWD	Silicon membranes; 200µm x 200µm; various coating options available	–	–	–
	SIWDS	Silicon membranes; 20µm x 20µm; various coating options available	–	–	–
	PORE-NI	Single or array of Nanopore on Silicon Nitride (NIWD) membrane	–	–	–
	Pore-OX	Single, 2 x 2 or 5 x 5 array of Nanopore on Silicon Oxide (OXWD) membrane	–	–	–
	Pore-Si	Single, 2 x 2 or 5 x 5 array of Nanopore on single crystal silicon (SIWD) membrane	–	–	–